Scanning electron microscopes (SEM) are highly developed instruments for material and surface analysis that make it possible to visualise structures in the micro and nanometre range. In contrast to optical microscopes, which work with visible light, they use a finely focussed electron beam that is guided across the sample surface line by line. The resulting interactions between the electrons and the material generate various signals, from which a digital image of the surface morphology is created.
The Phenom used at the institute belongs to the category of desktop scanning electron microscopes and combines high image quality with particularly simple operation and a compact design. In addition to the actual microscope with electron column and vacuum chamber, the entire system also includes the fore-vacuum pump and the touchscreen monitor.
The Phenom is operated almost entirely via the touchscreen, which is also supported by a rotary control. All important functions such as focus, contrast, brightness, magnification and image storage can be controlled via clearly structured menus. In optical mode, the integrated camera enables quick orientation and positioning of the sample. A simple command can then be used to switch to electron mode, in which the system automatically switches from optical to high-resolution electron imaging. Both manual and automatic routines are available for focusing and image optimisation. The image acquisition and display parameters can be customised and resolutions between 456 and 2048 pixels with specific image quality, exposure time and noise suppression can be selected. Favourite settings can also be saved and called up at any time. The captured images can be stored on a USB memory stick or directly on a central server via a network. In archive mode, saved images can also be viewed, compared, deleted or measured.
The Phenom combines the precision and performance of a fully-fledged scanning electron microscope with the user-friendliness of a compact laboratory system. Thanks to its intuitive operation, robust design and fast operational readiness, it enables efficient and reproducible material analyses.
