Image
![Bild eines Röntgendiffraktometers XRD Orion Comet P2](/sites/default/files/styles/max_325x325/public/2023-11/tubaf_orion2_4000.jpg?itok=nQZcIA_q)
C. Schimpf
specifications
manufacturer: XRD Eigenmann GmbH (Seifert Analytical X-Ray)
technical specifications:
- θ–θ X-ray diffractometer
- angular range: 2θ = 10° ... 165°
- anode material: Cu
- 2 primary beam paths for switching between parafocussing and parallel beam geometry
- energy discrimminating 0D detector (Ketek AXAS-M) with ~130 eV energy resolution (suitable for X-ray fluorescence measurements)
- (x,y,z) sample mount to accommodate virtually all sample geometries
typical applications:
- fast, routinely quantitative phase analysis
- determination of lattice parameters
- determination of microstructure and real structure parameters through analysis of the (anisotropic) line broadening