manufacturer: XRD Eigenmann GmbH (Seifert Analytical X-Ray)

technical specifications:

• θ–θ X-ray diffractometer
• angular range: 2θ = 10° ... 165°
• anode material: Cu
• 2 primary beam paths for switching between parafocussing and parallel beam geometry
• energy discrimminating 0D detector (Ketek AXAS-M) with ~130 eV energy resolution (suitable for X-ray fluorescence measurements)
• (x,y,z) sample mount to accommodate virtually all sample geometries

typical applications:

• fast, routinely quantitative phase analysis
• determination of lattice parameters
• determination of microstructure and real structure parameters through analysis of the (anisotropic) line broadening