manufacturer: Freiberger Präzisionsmechanik GmbH | Rich. Seifert Co. GmbH & Co. KG

technical specifications:

• horizontal X-ray diffractometer with parallel beam (θ–2θ)
• anode material: Cu (point focus)
• angular range: 2θ = 10° ... 150°
• flat Si single crystal monochromator in the primary beam to cut off the Cu-Kα₂ radiation component
• ½-circle Eulerian cradle to accommodate flat bulk samples
• analyser: flat Si single crystal monochromator (on the secondary side)
• NaI(Tl) scintillation counter (0D detector)

typical applications:

• measurement of reciprocal lattice points with high resolution
• 'reciprocal space mapping' in the WAXS range