manufacturer: Bruker AXS GmbH, Karlsruhe (Germany)

technical specifications:

• horizontal X-ray diffractometer with parallel beam (θ–2θ)
• anode material: Cu (point focus)
• angular range: 2θ = 10° ... 130°
• incident beam is parallelised by a polycapillary optics (point focus with Ø 2 mm)
• ¼-circle Eulerian cradle with (x,y,z)-sample stage to accommodate sample with different geometries (max. 5 kg sample mass)
• parallel plate collimator in the diffracted beam (acceptance: 0.23°)
• Li-drifted Si-solid state scintillation counter (0D detector)

typical applications:

• local X-ray diffraction for qualitative/quantitative phase analysis
• determination of residual stresses of the I. kind according to the sin²ψ-sin(2ψ) method (full stress tensor)
• recording of pole figuresfor the analysis of preferred crystal orientations (textures)