manufacturer: Bruker AXS GmbH, Karlsruhe (Germany)

technical specifications:

• X-ray diffractometer with Bragg-Brentano geometry (θ–θ)
• angular range: 2θ = 10° ... 160°
• anode material: Cu (other anode materials possible)
• different sample stages:
  • high temperature chamber MTC-Hightemp+ (25°C ... 1800°C) with Ta- or Pt/Rh heating strip (resistive heating)
  • low temperature chamber MTC-LowTemp (-120°C ... 400°C) with Cu cooling block and AlCr heating strip
  • inert atmosphere available (Ar, N₂, vacuum up to 7×10^-5 mbar)
  • temperature control via thermocouples
• suitable for powder samples (corundum crucibles) or flat bulk samples directly on the heating strip
• check of sample position via shadowing of the primary beam
• position sensitive semiconductor solid state detector LynxEye XE (191 channels, opening covers 2θ~2.7°) with <680 eV energy resolution
• measurement speed yielding acceptable signal-to-noise ratios: 0.25s ... 0.5s per angular step

typical applications:

• investigation of phase transitions at high and low temperatures
• determination of lattice parameters and thermal expansion
• tracking of chemical reactions
• observation of microstructure changes at high temperatures