manufacturer: Bruker AXS GmbH, Karlsruhe (Germany)

technical specification:

• X-ray diffractometer in Bragg-Brentano geometry (θ–2θ)
• anode material: Co
• angular range: 2θ = 10° ... 160°
• focussing Johannson incident beam monochromator (SiO₂) to cut off the Co-Kα₂ radiation component
• rotating sample stage for powder and bulk samples
• position sensitive semiconductor solid state detector LnyxEye (191 channels, opening covers 2θ~2.7°)

typical applications:

• quantitative phase analysis, especially for complex samples (low symmetry phases, complex samples with many phases)
• very precise measurement of lattice parameters, also for low symmetry phases
• detailed analysis of microstructure/real structure of the phases