manufacturer: JEOL Ltd.

technical specifications:

• high resolution transmission electron microscope with STEM mode
• accelleration voltage: 80 keV and 200 keV
• EDX detector
• Ω-filter for energy filtered imaging and diffraction as well as electron energy loss spectroscopy (EELS)
• Cs-corrector for the reduction of the spherical abberation of the condensor
• BF/ADF- and HAADF-detectors
• electron diffraction with parallel (SAED) and convergent (CBED) beam
• highly sensitive 2K×2K CCD camera for image aquisition

typical applications:

• microstructure imaging with magnifications up to atomic resolution (resolution limit 0.19 nm)
• local diffraction analysis (phase analysis, orientation relationships)
• local, qualitative and quantitative chemical analysis

contact information

• Dr. M. Motylenko
  motylenk [at] ww [dot] tu-freiberg [dot] de (motylenk[at]ww[dot]tu-freiberg[dot]de)
  Tel.: +49 3731 39 3121
• Please see our TEM user rules