Image
C. Schimpf
Specifications
manufacturer: JEOL Ltd.
technical specifications:
- high resolution transmission electron microscope with STEM mode
- accelleration voltage: 80 keV and 200 keV
- EDX detector
- Ω-filter for energy filtered imaging and diffraction as well as electron energy loss spectroscopy (EELS)
- Cs-corrector for the reduction of the spherical abberation of the condensor
- BF/ADF- and HAADF-detectors
- electron diffraction with parallel (SAED) and convergent (CBED) beam
- highly sensitive 2K×2K CCD camera for image aquisition
typical applications:
- microstructure imaging with magnifications up to atomic resolution (resolution limit 0.19 nm)
- local diffraction analysis (phase analysis, orientation relationships)
- local, qualitative and quantitative chemical analysis