EBSD phase map - Stahlpartikel
C. Quitzke

Technical specifications

Manufacturer:
  • ZEISS
Technical data:
  • EDS, WDS, EBSD, STEM
  • Resolution: 0.8 nm
  • Acceleration voltage: 300 V to 30 kV in 10 V steps
  • Magnification: 15x to 1.000.000x
  • Beam current: 1 pA to 20 nA, electronic optibeam, Gemini
  • Detectors:
    • Each 2 x secondary electron detector, backscattered electron detector, in-lens
    • SDD detector for EDS, 10 mm2 active area, energy resolution < 129 eV, for Mn-Kα radiation, detection from boron (OZ 5)
    • WDS system TEXS, 5 crystals, X-ray capillary system
    • EBSD system OIM XM4, DigiViewIV CCD camera
Typical applications:
  • Analysis of inclusions, precipitates and microstructures (fracture surfaces), phases and subphases, grain boundaries and subgrain boundaries with regard to structural features and chemical composition

Contact

Dr.-Ing. Armin Franke
Ledebur-Bau
Leipziger Straße 34
Room 212
+49 3731 39-2413
Armin [dot] Franke [at] iest [dot] tu-freiberg [dot] de