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Auflichtmikroskop Axio Observer Z1m
M. Wendler

Technical specifications

Manufacturer:
  • ZEISS
Technical data:
  • Magnification: 25 - 1000x
  • Motorised movable X-Y table
  • Motorised Z-focus
  • Image contrast:
    • bright field and dark field
    • DIC (differential interference contrast)
  • Image analysis software: ZenCore 3.6
    • Determination of non-metallic inclusions in steels (oxides, sulphides, nitrides) according to EN 10247, DIN 50602, ASTM E45a, ISO 4967, JIS G0555, GB/T 10561 and SEP 1571
    • Characterisation of powder particles
Typical applications:
  • Light microscopic microstructure assessment of metallic materials
  • Imaging of large sample areas using tiled images
  • Automatic 2D image analysis

Contact

Dr.-Ing. Marco Wendler
Ledebur-Bau
Leipziger Straße 34
Room 207
+49 3731 39-3605
Marco [dot] Wendler [at] iest [dot] tu-freiberg [dot] de