Sebastian's doctoral project is dedicated to a central topic in the modern semiconductor industry: the further development of ultrasound scanning acoustic microscopy (SAM) for defect analysis and quality assurance. This project addresses the challenges posed by advancing miniaturisation, more complex structures and new materials in microelectronics.

The project aims to develop transient simulation algorithms that accurately predict the propagation of sound waves in complex semiconductor devices. By utilising semi-analytical methods, previous limitations in computing time are to be overcome, while at the same time taking into account the physical properties of high-frequency sound waves in the range from 50 MHz to 1 GHz. These algorithms enable a more precise analysis of the interaction of sound waves with defects and support the development of new measurement methods based on industry requirements. This should improve both fault detection and sustainability in the production of microelectronic systems.

The research will be carried out in close collaboration with partners from industry and in the context of international projects to ensure practice-orientated results. In addition, the doctoral project is supported by a scholarship from the European Social Fund (ESF), which significantly promotes the research work and emphasises the importance of further scientific qualification.

Further information on the ESF doctoral scholarship