Inferential statistics of electron backscatter diffraction data from within individual crystalline grains

TitelInferential statistics of electron backscatter diffraction data from within individual crystalline grains
Art der PublikationJournal Article
Year of Publication2010
AutorenBachmann, F, Hielscher, R, Jupp, PE, Pantleon, W, Schaeben, H, Wegert, E
JournalJ. Appl. Cryst.
Volume43
Issue6
Pagination1338 - 1355
Date Published2010/12/01
ISBN Number0021-8898
Schlüsselwörtercrystallographic symmetry, electron backscatter diffraction, highly concentrated Bingham quaternion distribution, Individual orientation measurements, MTEX, orientation distribution, Texture analysis
ZusammenfassungHighly concentrated distributed crystallographic orientation measurements within individual crystalline grains are analysed by means of ordinary statistics neglecting their spatial reference. Since crystallographic orientations are modelled as left cosets of a given subgroup of SO(3), the non-spatial statistical analysis adapts ideas borrowed from the Bingham quaternion distribution on {\bb S}^3. Special emphasis is put on the mathematical definition and the numerical determination of a `mean orientation' characterizing the crystallographic grain as well as on distinguishing several types of symmetry of the orientation distribution with respect to the mean orientation, like spherical, prolate or oblate symmetry. Applications to simulated as well as to experimental data are presented. All computations have been done with the free and open-source texture toolbox MTEX.
URLhttp://dx.doi.org/10.1107/S002188981003027X
Short TitleJournal of Applied Crystallography