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Apparative equipment

Electron beam microprobe JEOL JXA-8230 (installation 01/2019) with EDX (JEOL) and 5 spectrometers:

  • Spectrometer 1: PETJ; TAP; LDE1; LDE2; Ar-Flow
  • Spectrometer 2: PETH; LDE1H; Ar-Flow
  • Spectrometer 3: TAP; LDE2; Ar-Flow
  • Spectrometer 4: PETH; LIFH; Xe-Ar-Cap
  • Spectrometer 5: PETL; LIFL; Xe-Ar-Cap

Standard sample holder fixed in sample chamber.

Sample holder:

  • Holder for 3 thin sections of 48 x 28 mm each
  • Holder for 6 round samples diameter 25 mm

Suitable samples

We analyse natural and synthetic samples such as minerals, rocks, ores, fossils, ceramics, gemstones and glasses, mainly of silicate, sulphide and oxide composition. If you are interested in analyses of metals and alloys, please contact our experienced colleagues at the Institute of Materials Science. Suitable samples must be:

  • dry,
  • solid,
  • stable in vacuum,
  • stable under the influence of electron beams between 10 keV and 25 keV as well as
  • flat and polished

. All samples are coated with a thin carbon layer to ensure electrical conductivity.