Publikationen
Found 2 results
2011
Bachmann F, Hielscher R, Schaeben H. Grain detection from 2d and 3d EBSD data—Specification of the MTEX algorithm. [Internet]. 2011;111(12):1720 - 1733. Available from: http://www.sciencedirect.com/science/article/pii/S0304399111001951
2010
Bachmann F, Hielscher R, Jupp PE, Pantleon W, Schaeben H, Wegert E. Inferential statistics of electron backscatter diffraction data from within individual crystalline grains. J. Appl. Cryst. [Internet]. 2010;43(6):1338 - 1355. Available from: http://dx.doi.org/10.1107/S002188981003027X Abstract