Publikationen
Found 1 results
2010
Bachmann F, Hielscher R, Jupp PE, Pantleon W, Schaeben H, Wegert E. Inferential statistics of electron backscatter diffraction data from within individual crystalline grains. J. Appl. Cryst. [Internet]. 2010;43(6):1338 - 1355. Available from: http://dx.doi.org/10.1107/S002188981003027X Abstract