Efficient and accurate measurement of very sharp crystallographic textures: A new measurement strategy

TitelEfficient and accurate measurement of very sharp crystallographic textures: A new measurement strategy
Art der PublikationJournal Article
Year of Publication2012
AutorenBachmann, F, Witte, M, Nguyen, TQ, Schaeben, H, Gottstein, G
Volume60
Issue10
Pagination4229 - 4234
Date Published2012/6//
ISBN Number1359-6454
SchlüsselwörterPole figure measurement, Texture, Traveling salesman problem, X-ray diffraction (XRD)
URLhttp://www.sciencedirect.com/science/article/pii/S1359645412002558
Short TitleActa Materialia