2006

L. Havela, K. Miliyanchuk, D. Rafaja, T. Gouder, F. Wastin:
Structure and magnetism of thin UX layers,
J. Alloys Comp. 408-412 (2006) 1320-1323.

M. Dopita, D. Rafaja:
X-ray residual stress measurement in titanium nitride thin films,
Z. Kristallographie Suppl. 23 (2006) 67-72.

D. Rafaja, A. Poklad, V. Klemm, G. Schreiber, D. Heger, M. Šíma, M. Dopita:
Some consequences of the partial crystallographic coherence between nanocrystalline domains in Ti-Al-N and Ti-Al-Si-N coatings,
Thin Solid Films 514 (2006) 240-249.

D. Šimek, R. Kužel, D. Rafaja:
Reciprocal-space mapping for simultaneous determination of texture and stress in thin films,
J. Appl. Cryst. 39 (2006) 487-501.

D. Rafaja, M. Dopita, M. Ružicka, V. Klemm, D. Heger, G. Schreiber, M. Šíma:
Microstructure development in Cr-Al-Si-N nanocomposites deposited by cathodic arc evaporation,
Surface and Coatings Technology 201 (2006) 2835-2843.

K. Kremmer, G. Schreiber, M. Masimov, V. Klemm, D. Rafaja, O. Yezerska, M. Schneider:
Mikrostrukturausbildung elektrochemisch abgeschiedener Kupferschichten,
in B. Wielage (Hrsg.): Werkstoffe und Werkstofftechnische Anwendungen 24 (2006) 251 – 256, ISSN: 1439-1597.

A.S. Parshin, S.N. Varnakov, A.A. Lepeshev, D. Rafaja, L. Kalvoda and S.G. Ovchinnikov:
Characterisation of Si/Fe Multilayers by Electron Spectroscopy and Small-Angle X-ray Scattering,
The Physics of Metals and Metallography 101 (2006) Suppl. 1, S78-S80.