Publikationen 2005

Internationale Zeitschriften

Proceedings

  • A. Dorner-Reisel, G. Reisel, E. Müller, L. Kübler
    Untersuchungen zum Verschleißverhalten von RF-PECVD DLC-Schichten auf Polyethylen-Substraten
    TU Chemnitz, Tagungsband zur 6. Industriefachtagung „Oberflächen- und Wärmebehandlungstechnik“ und zum 8. Werkstofftechnischen Kolloquium 29./30.09.2005, S. 293 - 300
  • M. Florovic, R. Srnanek, J. Kovac, G. Irmer, B. Sciana, D. Radziewicz,
    D. Pucicki, M. Tlaczala

    Zn delta-doped GaAs hetero-bipolar transistor structure investigations by Raman spectroscopy
    14th European Workshop on Heterostructure Technology, Smolenice Castle, Slovakia, Okt. 2 - 5, 2005
  • M. Herms, G. Irmer, P. Verma, G. Goerigk
    Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering
    Proc. of the 10th SPIE Annual International Symposium: Nondestructive Evaluation for Health Monitoring and Diagnostics, March 6 – 10, 2005, San Diego, California (USA)
  • J. Kortus
    Mechanism of superconductivity in boron doped Diamond
    16th European Conference on Diamond, Diamond Like Materials, Carbon Nanotubes and  Nitrides, September 11 - 16, 2005, Toulouse, France
  • J. Kortus Electronic structure: The key for understanding MgB2
    Psik-2005 Conference, September 17 - 21, 2005, Schwäbisch Gmünd, Germany
  • R. Srnanek, E. Korecka, R. Kinder, A. Vincze, D. Donoval, M. Florovic, I. Novotny, G. Irmer, D. S. Mc Phail, A. Christophi, B. Sciana, D. Radziewicz, M. Tlaczala Micro-Raman analysis of bevelled Zn delta-doped GaAs
    Proceedings EDS’05 IMAPS CS International Conference Brno, Czech Republic, Sept. 15 - 16, 2005, 226 - 231
  • R. Srnanek, G. Irmer, G. Richardson, M. Florovic, J. Kovac, R. Zalusky, S. Hasenöhrl, J. Novak
    Micro-Raman spectroscopy of InP-based structures on bevelled samples
    14th European Workshop on Heterostructure Technology, Smolenice Castle, Slovakia, Okt. 2 - 5, 2005
  • A. Vince, J. Kovac, R. Srnanek, M. Florovic, G. Irmer, D. S. Mc Phail SIMS investigation of Si delta doped layer in GaAs
    International Conference WOCSDICE 05, Cardiff, UK, May 2005