B. H. Bairamov, V. V. Toporov, V. A. Voitenko, G. Irmer, J. Monecke Electron-phonon interactions in multi-component plasma created by light-and heavy hole gas in polar semiconductors: from bulk to quantum dot structures phys. stat. sol. (c) 1 (2004) 2773 – 2778
A. Dorner-Reisel, C. Schürer, G. Irmer, E. Müller Electrochemical corrosion behaviour of uncoated and DLC coated medical grade Co28Cr6Mo Surf. Coat. Technol. 177-178 (2004) 830 - 837
M. Florovic, R. Srnanek, J. Kovac, J. Geurts, M. Lentze, G. Irmer, B. Sciana, D. Radziewicz, M. Tlaczala Diagnostics of InxGa1-xAs/GaAs quantum well by micro-photoluminescence Proceedings of the 10th International Workshop on Applied Physics of Condensed Matter (APCOM), June 16 – 18, 2004, Casta-Pila, Slovak Republic, pp. 66 – 69
M. Herms and G. Irmer Raman spectroscopy – a versatile tool for characterization of semiconductor materials, devices and processes University of Dayton, Ohio, USA, October 29, 2004, (Kolloquiumsvortrag)
G. Irmer, J. Monecke, P. Verma Light scattering of semiconducting nanoparticles, in: Encyclopedia of Nanoscience and Nanotechnology (Ed. H. S. Nalwa), American Scientific Publishers, California, USA, 2004, 561 - 586
G. Irmer, P. Prunici, J. Monecke, L. Sirbu, I. M. Tiginyanu, G. Gärtner Nanoporous InP studied by micro-Raman scattering 19th International Conference on Raman Spectroscopy (ICORS 2004), August 8 – 13, 2004, Gold Coast, Australia, pp. 496 - 497
J. Monecke, J. Bezrukova, W. Cordts, G. Richardson Second order nonlinear susceptibility coefficients of porous semiconducting compounds phys. stat. sol. (b) 241 (2004) R8 - R10
T. Monecke, J. Monecke, J. B. Gemmell Fractal analysis of vein thicknesses in drill core from the Hellyer massive sulphide deposit, Australia Proceedings of the 4th International Conference on “Fractals and Dynamic Systems in Geoscience”, May 19 – 22, 2004, TU München/Kloster Seeon, S. 70 – 73
T. Monecke, J. Monecke, P. M. Herzig, J. B. Gemmell, W. Mönch Fractal analysis of element abundance data: a dynamic model for the metasomatic enrichment of base and precious metals Proceedings of the 4th International Conference on “Fractals and Dynamic Systems in Geoscience”, May 19 – 22, 2004, TU München/Kloster Seeon, S. 74 – 77
P. Prunici, G. Irmer, J. Monecke, L. Sirbu, I. M. Tiginyanu Micro-Raman study on columnar GaAs nanostructures 4th International Conference on Porous Semiconductors - Science and Technology, March 14 - 19, 2004, Cullera-Valencia, Spain, pp. 258 - 259
P. Prunici, G. Irmer, J. Monecke, I. M. Tiginyanu Charge carriers in columnar nanostructures of porous GaAs and InP using micro-Raman scattering Tagungsband der Frühjahrstagung des Arbeitskreises Festkörperphysik bei der DPG, Regensburg (2004) S. 234
P. Prunici, G. Irmer, J. Monecke, R. Srnánek, D. Radziewicz Charge carrier excitation in a GaAs:Si bevelled structure studied by using micro-raman spectroscopy Proceedings of the 10th International Workshop on Applied Physics Condensed Matter (APCOM), June 16 – 18, 2004, Castá – Pila, Slovak Republic, pp. 211 – 214
W. W. Rudolph, D. Fischer, G. Hefter, G. Irmer Raman spectroscopic investigations of speciation in MgS04(aq) 19th International Conference on Raman Spectroscopy (ICORS 2004), August 8 – 13, 2004, Gold Coast, Australia, pp. 146 - 147
W. W. Rudolph and G. Irmer Raman and infrared spectroscopic investigations of aqueous alkali metal phosphate (PO43-) solutions 19th International Conference on Raman Spectroscopy (ICORS 2004), August 8 – 13, 2004, Gold Coast, Australia, pp. 358 - 359
W. W. Rudolph and G. Irmer Analysis of ionic species in natural mineral waters studied by Raman spectroscopy 19th International Conference on Raman Spectroscopy (ICORS), August 8 – 13, 2004, Gold Coast, Australia, pp. 362 - 363
W. W. Rudolph, D. Fischer, C. C. Pye, G. Irmer Raman and infrared spectroscopic investigation of In(OH2)3+(aq). 19th International Conference on Raman Spectroscopy (ICORS), August 8 – 13, 2004, Gold Coast, Australia, pp. 370 - 371
R. Srnánek, J. Geurts, M. Lentze, G. Irmer, P. Brdecka, P. Kordos, A. Förster, B. Sciana, D. Radziewicz, M. Tlaczala Study of d-doped GaAs layers by micro-Raman spectroscopy on bevelled samples Appl. Surface Science 230 (2004) 379 – 385
R. Srnánek, L. Peternai, J. Kovác, M. Florovic, J. Geurts, M. Lentze, G. Irmer, A. Förster, P. Kordos Characterization of Si delta-doped AlGaAs/GaAs quantum-well by optical methods on bevelled structures 28th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe (WOCSDICE), May 17 – 19, 2004, Smolenice Castel, Slovakia, pp. 139 – 140
R. Srnanek, R. Kinder, M. Florovic, G. Irmer, P. Prunici, J. Geurts, M. Lentze, B. Sciana, E. Korecka, I. Novotny, D. Radziewicz, M. Tlaczala Diagnostics of Zn-delta doped GaAs layers by micro-photoluminescence, micro-Raman spectroscopy and ECV method Proceedings of the 11th Electronic Devices and Systems Conference (EDS), September 9 – 10, 2004, Brno, Czech Republic, pp. 269 – 272
R. Srnanek, M. Vesely, A. Vincze, M. Florovic, J. Kovac, G. Irmer, P. Prunici, B. Sciana, D. Radzdiewicz, M. Tlaczala Determination of doping concentration in very thin GaAs:Si layers by micro-Raman spectroscopy on beveled samples 10th Joint Vacuum Conference (JVC), September 28 – Oktober 2, 2004, Portoroz, Slovenija, pp. 92 – 93 (Poster)
A. Vincze, J. Kovac, R. Srnanek, J. Sigmund, H. L. Hartnagel, G. Irmer Annealing behaviour of low temperature grown GaAs investigated by Raman spectroscopy Proceedings of the 5th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), October 17 – 21, 2004, Smolenice Castle, Slovakia, pp. 115 – 118
