Scanning electron microscope

Taskforce REM

Scanning electron microscope

Scanning electron microscopeThe high-quality characterization of the microstructure of materials is an important basis for a scientific description and development of material technologies and is therefore of central importance for the work of our Institut. Optical metallography only allows a general characterization of the microstructure and is no longer sufficient for the current state of science. For an in-depth analysis, the institute has a scanning electron microscope with a wide variety of detectors and additional options. In addition to energy-dispersive X-ray spectroscopy (EDX), our microscope also has wavelength-dispersive X-ray spectroscopy (WDX), which enables precise detection of many accompanying elements and the finest C distributions. Thanks to the highly efficient EBSD detector with a recording speed of more than 3000 pps, fast coupled EBSD / EDX mapping can be carried out for phase identification and crystal orientation determination.

The focus of our institute is on the characterization of material behavior during and after deformation. For this purpose, our institute uses an in-situ heating-compression module with a maximum force of 10 kN and a controllable temperature in the range from RT up to 1000 °C. The fast EBSD / EDX detectors open up the possibility of in-situ investigations of the dynamic microstructural changes during and after hot deformation as well as during phase transformation and precipitation processes, that control the material properties of metals. The additional WDX analysis of the selected structural areas helps to understand the diffusion processes of light elements in the material, since their distribution cannot be imaged with sufficient accuracy using an EDX detector.

Gemini 2 Scanning electron microscope

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  • Taskforce REM: Susanne Berndorf
  • Taskforce REM: Markus Kirschner
  • Taskforce REM: Gregor Korpala